This August, the Departments of Materials Science & Engineering (MSE) and Electrical & Computer Engineering (ECE) successfully hosted the first offering of the Micro-Credential in Semiconductor Fabrication and Inspection, sponsored by Hitachi High-Tech..
Led by Prof. Jane Howe (MSE), Prof. Wai Tung Ng (ECE), and Dr. Maryam Golozar, the intensive four-day program brought together graduate students, senior undergraduates, and industry professionals for hands-on training at the Toronto Nanofabrication Centre (TNFC) and the Ontario Centre for the Characterization of Advanced Materials (OCCAM). The lab sessions were coordinated and instructed by graduate students, Michelle Lin, Terry Li, and Edward Xu.
Under the Participants gained practical skills in semiconductor fabrication, inspection, and characterization methods, and many highlighted the unique value of accessing world-class facilities and expert mentorship.
“It was exciting to see participants not only mastering the theoretical concepts, but also confidently using electron microscopes to inspect semiconductors, a hands-on experience directly relevant to Canada’s semiconductor future.",” said Dr. Maryam Golozar, course instructor.“This program showcases the strength of our facilities and the expertise we have at U of T. We are proud to help prepare the next generation of talent for one of Canada’s most strategic industries,” said Prof. Jane Howe, Department of Materials Science & Engineering.
The success of this inaugural offering demonstrates strong demand for specialized, experiential learning opportunities in the semiconductor sector. MSE and ECE look forward to offering future sessions of this micro-credential to support Canada’s growing talent pipeline.
