Nogami, Jun

Nogami, Jun

Jun Nogami | BASc (Toronto), MASc (Stanford), PhD (Stanford), FAAAS, PEng
Professor

Office: WB156
T: 416.946.0684
E: jun.nogami@utoronto.ca

Research Group: Nanostructured Growth & Characterization Laboratory

 

Research Areas

Integration of Top Down and Bottom Up Nanofabrication
Many interesting nanostructures can arise during epitaxial growth of thin film electronic materials. Self assembly of these nanostructures represents a “bottom up” approach to nanofabrication. At the same time, integration of such nanostructures into devices will require electrical connections, as well as proximal gate electrodes, etc, which are generally made with lithographic techniques: a “top down” fabrication technique. We are particularly interested in nanostructures that are grown in ultra high vacuum (UHV) on atomically pristine substrates. We are developing “top down” nanofabrication techniques that are compatible with the UHV growth methods used to create our nanostructures. Current research in this area is focusing on the ultimate limits of nanostencilling in UHV.

Surface Structure Studies using Scanned Probe Microscopy
Much of our research involves the measurement of atomic surface structure and surface topography using both Scanning Tunneling Microscopy in ultra high vacuum, and atomic force microscopy in air. Many of our past studies on surface atomic structure have yielded insight into the fundamental mechanisms of the growth of metals on silicon surfaces.

Research Clusters

Link to Google Scholar 

Select publications:

  • Shivani Varshney, Longxing Chi, Chandra Veer Singh and Jun Nogami, "Atomic structure of PbBrthin films on Ag (111)", Solid State Communications, 343, 114651 (2022) DOI: 10.1016/j.ssc.2022.114651
  • Longxing Chi, Chandra Veer Singh and Jun Nogami, "Quantum Well States and Sizable Rashba Splitting on Pb Induced α-phase Bi/Si(111) Surface Reconstruction", Nanoscale 13, 16622 (2021) DOI: 10.1039/d1nr04588a
  • Shivani Varshney and Jun Nogami,  "Atomic structure of CsBr thin films on Ag (111)",  J. Vac. Sci. Technol. A 39, 023203 (2021); DOI: 10.1116/6.0000808
  • Longxing Chi, Jun Nogami, and Chandra Veer Singh, "Bias Dependent Imaging and Defect Analysis of the Bi/Si(111) Ö3´Ö3-b Phase", , Physical Review B 103, 075405 (2021) DOI: 10.1103/PhysRevB.103.075405
  • William S. Huxter, Chandra Veer Singh, and Jun Nogam, "Hindered surface diffusion of bonded molecular clusters mediated by surface defects", Phys Rev Materials 4, 093401 (2020) DOI: 10.1103/PhysRevMaterials.4.093401
  • William S. Huxter, Kai Huang, Jun Nogami, and Chandra Veer Singh, “How Silver Grows on the Silicon (001) Surface: A Theoretical and Experimental Investigation", ACS Applied Electronic Materials 1,122-131 (2019)
  • Kai Huang (黄恺), William S. Huxter, Chandra Veer Singh, and Jun Nogami,  “Identification of Tetramers in Silver Films Grown on the Si(001) Surface at Room Temperature”, Journal of Physical Chemistry Letters 9, 6275-6279 (2018) DOI: 10.1021/acs.jpclett.8b02746
  • Kitty Kumar, Ali Khalatpour, G. Liu, Jun Nogami and  Nazir P. Kherani,  “Converging photo-absorption limit in periodically textured ultra-thin silicon foils and wafers”, Solar Energy 155, 1306-1312 (2017)
  • I. Dutil, V. Prakash, J. Nogami, and SD Ramsay, “Introduction of Reusable Learning Objects in First Year Materials Science and Engineering Course”, Proc: 2015 ASEE Annual Conference and Exposition,  26.1033.1 - 26.1033.17 (2015)

 

  • Fellow, The School of Engineering at The University of Tokyo, 2018
  • Fellow, American Academy for the Advancement of Science (FAAAS), 2010

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