Description:
Electron microscopy has been widely used for microstructural and chemical analysis of materials from mm down to atomic length scales. This course specifically covers the practical aspects of electron microscopy, including scanning/transmission electron microscopy (S/TEM), scanning electron microscopy (SEM) and focused ion beam (FIB), electron backscattered diffraction (EBSD) and energy dispersive X-ray spectroscopy (EDS). Students will learn the hands-on operations of SEM and EDS. It is open to graduate students with a bachelor’s degree in engineering or science.
Course Textbooks (both electronic versions are available to U of T students):
1. Transmission Electron Microscopy: A Textbook for Materials Science D.B. Williams and C.B. Carter, 2nd Ed., Springer (2009) https://link-springer-com.myaccess.library.utoronto.ca/book/10.1007%2F978-0-387-76501-3
2. Scanning Electron Microscopy and X-ray Microanalysis, 4th Ed. J.I. Goldstein, D.E. Newbury, J.R. Michael, N.W.M. Ritchie, J.H.J Scott, D.C. Joy. Springer (2018) https://link-springer-com.myaccess.library.utoronto.ca/book/10.1007/978-1-4939-6676-9
Schedule:
Tuesday May 5 to Friday May 8 and Monday May 11.
· May 5 to Friday May 8: 3 hour lecture each morning, from 9 am to noon, and 4 hour Practical sessions (labs) each afternoon in the Open Center for the Characterization of Advanced Materials (OCCAM), PT165-167.
· May 11: group presentation and individual oral/ hands-on evaluations.
This course is also set up as Micro-Credential Course
Details: https://mse.utoronto.ca/news-practical-aspect-of-electron-microscopy/