Micro-Credential Course: Practical Aspect of Electron Microscopy
New Micro-Credential Course: Practical Aspect of Electron Microscopy (May 5-8, 2026)
Electron microscopy has been widely used for microstructural and chemical analysis of materials from milimeter down to atomic length scales. This course specifically covers the practical aspects of electron microscopy, including scanning/transmission electron microscopy (S/TEM), scanning electron microscopy (SEM) and focused ion beam (FIB), electron backscattered diffraction (EBSD) and energy dispersive X-ray spectroscopy (EDS).
Participants will learn the hands-on operations of scanning electron microscopy (SEM) and energy dispersive X-ray spectroscopy (EDS).
This intensive, hands-on course is open to graduate students with a bachelor’s degree in engineering or science. Participants will engage in experiential learning at the Ontario Centre for the Characterization of Advanced Materials (OCCAM).
Eligibility
This intensive, hands-on course is open to graduate students with a bachelor’s degree in engineering or science.
Course Dates & Structure
- Tuesday May 5th to Friday May 8th (4 days): 9 AM -12PM, and 4 hour Practical sessions (labs) in the afternoon & Monday May 11th, 2026
- Monday May 11th: group presentation and individual oral/hands-on evaluations.
Location
University of Toronto, Department of Materials Science & Engineering
- Lectures are held in Wallberg Building, Room 130.
- Practical sessions are held in Open Center for the Characterization of Advanced Materials (OCCAM), PT165-16.
Details
Course Fees
UofT students: $400
Alumni: $500
Public: $1000
Certification
Participants will receive a certificate upon completion of the course.
Registration
Registration Link: https://www.ece.utoronto.ca/newmicrocredential/
If you have any questions please contact Harriet Chan: mse.grad@utoronto.ca.